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Beilstein J. Nanotechnol. 2018, 9, 1220–1227, doi:10.3762/bjnano.9.113
Figure 1: (a) Scanning electron micrograph of a FEBID pad. (b) Atomic force micrograph of the same pad. (c + ...
Figure 2: (a) Raman spectra of a FEBID pad, FEBID precursor and the substrate. The complex structure of the p...
Figure 3: (a) Real and (b) imaginary part of the dielectric function of the measured FEBID material, averaged...
Figure 4: (a + b) Scanning electron micrographs of a single nanopillar (a) and a copper helix with three pitc...
Figure 5: (a) Array of 8 × 8 nanocones with a distance of 400 nm, base diameter of 80 nm and a height of 250 ...
Beilstein J. Nanotechnol. 2018, 9, 91–101, doi:10.3762/bjnano.9.11
Figure 1: Optical microscopy images showing the 200 nm SiO2/Si substrate and gold electrodes together with (a...
Figure 2: SEM-based average diameters of Co, Cu and Au FEBID agglomerates as function of the annealing temper...
Figure 3: Top: Raman spectra in the carbon range as a function of the post-growth annealing temperature of (a...
Figure 4: Electrical resistivities of Co–C, Cu–C and Au–C FEBID materials as a function of the annealing temp...
Figure 5: (a) Time-evolution of the electrical resistance during annealing in a 200 ppm H2 atmosphere, reveal...